Results 41 to 50 of about 312,838 (207)

A Radiation-Hardened Low-Power SRAM with Enhanced Write Capability for Space Applications

Applied Sciences
With continued scaling of CMOS technology, the critical charge required for state retention in SRAM cells has decreased, leading to increased vulnerability to radiation-induced soft errors such as single-event upsets (SEUs) and single-event multi-node ...
Sang-Jin Kim, Sung-Hun Jo
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Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area

Yuanzineng kexue jishu, 2022
Based on the test site at the Qinghai Tibet Plateau with an altitude of 4 300 m, atmospheric neutron single event effects of a 65 nm high speed large area static random access memory (SRAM) array were measured in real time.
ZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang
doaj  

Influence of nuclear de-excitation on observables relevant for space exploration [PDF]

, 2010
The composition of the space radiation environment inside spacecrafts is modified by the interaction with shielding material, with equipment and even with the astronauts' bodies.
Alain Boudard, Bondorf, Boudard, Cugnon, Davide Mancusi, Durante, Furihata, Gaimard, Iwase, Jean-Christophe David, Joseph Cugnon, Le Gentil, Mancusi, Napolitani, Sato, Serber, Sylvie Leray, Villagrasa-Canton, Yariv, Yariv   +19 more
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Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell

IEEE Access
The effects of single event upset (SEU) by alpha particles and heavy ions on the data flip of a 3 nm technology node gate-all-around (GAA) nanosheet field-effect transistor (NSFET) 6T static random-access memory (SRAM) cell was studied through technology
Minji Bang, Jonghyeon Ha, Minki Suh, Dabok Lee, Minsang Ryu, Jin-Woo Han, Hyunchul Sagong, Hojoon Lee, Jungsik Kim   +8 more
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Mitigating bit flips or single event upsets in epilepsy neurostimulators

Epilepsy and Behavior Case Reports, 2016
Objectives: The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators. Materials and methods: A case report of a single event upset or bit flip is discussed;
Alice X. Dong, Ryder P. Gwinn, Nicole M. Warner, Lisa M. Caylor, Michael J. Doherty   +4 more
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Accelerator simulation test technology and its application for single event effect evaluation in space

He jishu, 2023
BackgroundThe space environment contains numerous high-energy particles, and a single high-energy particle passing through a spacecraft shell bombards the electronic devices within, triggering single-particle effects such as device logic state upset and ...
CHEN Qiming, GUO Gang, SUI Li, LIU Jiancheng, ZHANG Yanwen, ZHANG Fuqiang, YIN Qian, HAN Jinhua, ZHANG Zheng, SUN Haohan   +9 more
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Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

Sensors, 2018
This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K.
Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivrey   +9 more
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Mutual interference induced by single event effects in CMOS circuits

AIP Advances, 2020
Single event effect (SEE) induced mutual interference in CMOS circuits, including single event (SE) induced coupling effects (crosstalk) and modulation in local supply voltage on power-supply rails, was studied based on the increase in metal interconnect
Lili Ding, Wei Chen, Tan Wang, Fengqi Zhang, Yinhong Luo, Guo-Qing Yang   +5 more
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Effects of space radiation on electronic microcircuits [PDF]

The single event effects or phenomena (SEP), which so far have been observed as events falling on one or another of the SE classes: Single Event Upset (SEU), Single Event Latchup (SEL) and Single Event Burnout (SEB), are examined.
Kolasinski, W. A.
core   +1 more source

Overview of software tools for modeling single event upsets in microelectronic devices

Безопасность информационных технологий, 2016
The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to
Anatoly Alexandrovich Smolin
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