Results 141 to 150 of about 16,144 (237)

SEU (single-event-upset) characterization of a hardened CMOS 64K and 256K SRAM

, 1989
F.W. Sexton, J.S. Fu, R.A. Kohler, R. Kogas, at, Los Angeles Aerospace Corp.   +5 more
openalex   +1 more source

Investigation on High-Temperature and High-Field Reliability of NMOS Devices Fabricated Using 28 nm Technology After Heavy-Ion Irradiation. [PDF]

Micromachines (Basel)
Cao Y, Zhang Z, Zhang L, Li M, Su S, Zhang W, Xu Y, Huang D, Liu L, Lv L, Ma X.   +10 more
europepmc   +1 more source

Impact of Radiotherapy on Malfunctions and Battery Life of Cardiac Implantable Electronic Devices in Cancer Patients. [PDF]

Cancers (Basel), 2023
Lisowski D, Lutyj P, Abazari A, Weick S, Traub J, Polat B, Flentje M, Kraft J.   +7 more
europepmc   +1 more source

Monte-Carlo simulation and contribution to understanding of Single-Event-Upset (SEU) mechanisms in CMOS technologies down to 20nm technological node

, 2011
Sławosz Uznański
openalex   +1 more source

New Developments in Field Programmable Gate Array (FPGA) Single Event Upsets (SEUs) and Fail-Safe Strategies

, 2011
Melanie D. Berg
openalex   +1 more source

Engineering error correcting dynamics in nanomechanical systems. [PDF]

Sci Rep
Jin X, Baker CG, Romero E, Mauranyapin NP, Hirsch TMF, Bowen WP, Harris GI.   +6 more
europepmc   +1 more source

First Evaluation of the Single Event Upset (SEU) Risk for Electronics in the CMS Experiment

, 1998
F. Faccio, M. Huhtinen, C. Detcheverry
openalex   +1 more source

A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays. [PDF]

Sensors (Basel)
Wang W, Li X, Chen L, Sun H, Zhang F.
europepmc   +1 more source

Evaluation of Single-Event Effect Current-Carrier Mapping Based on Experimental Data. [PDF]

Micromachines (Basel)
Bao M, Wang Y, Yang J, Li X.
europepmc   +1 more source

Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits. [PDF]

Sensors (Basel), 2020
Sarker MAR, Jung S, Ildefonso A, Khachatrian A, Buchner SP, McMorrow D, Paki P, Cressler JD, Song I.   +8 more
europepmc   +1 more source