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Mitigating bit flips or single event upsets in epilepsy neurostimulators [PDF]
Epilepsy and Behavior Case Reports, 2016 Objectives: The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators. Materials and methods: A case report of a single event upset or bit flip is discussed;
Alice X. Dong +4 more
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Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments [PDF]
MicromachinesAs semiconductor technologies advance, SRAM cells deployed in space systems face heightened sensitivity to radiation-induced soft errors. In conventional 6T SRAM, when high-energy particles strike sensitive nodes, single-event upsets (SEUs) may occur ...
Se-Yeon Park, Eun Gyo Jeong, Sung-Hun Jo
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Low power and high-speed quadrate node upset tolerant latch design using CNTFET [PDF]
Scientific ReportsScalability, leakage, short-channel effects, and reliability problems are some of the difficulties facing the semiconductor industry as it continues to experience a reduction in size.
Shaik Asiya, Satheesh Kumar S
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Comparative Analysis of the Aeronautical Certification Process Against Nonionizing Radiation and the Management Proposal for Ionizing Radiation [PDF]
Journal of Aerospace Technology and Management, 2022 Today, the certification process for onboard electro-electronic systems against nonionizing radiation can be considered mature and independent, having its own set of requirements.
Marcelo Tadeu Ferreira +1 more
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A computational analysis on the role of low energy proton-induced single event upset in a 65 nm CMOS SRAM [PDF]
مجله علوم و فنون هستهای, 2020 This investigation is a computational analysis of a kind of radiation effect on electronic devices, known as the single event upset (SEU) with the Geant4 toolkit.
M. Soleimaninia,, G. Raisali, A. Moslehi
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Applied Sciences, 2022 Space Electrostatic Discharge Effect (SESD) and Single Event Effect (SEE) are two major space environmental factors that cause spacecraft failure. Previous studies have established that both can lead to soft errors such as upset of memory cells.
Xuan Wang +5 more
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, 2021 In Universe, there are innumeral activities that keep on happening and a lot of effects that are produced as outcomes. One such example is Single Event Upset. SEU is the error generated in the operation performed by a due to the strike between a single ionizing particle like electron, proton or neutron and a sensitive node in micro-electronic device ...
Jilani, Aavesh +2 more
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Single-Event Upsets in Microelectronics [PDF]
MRS Bulletin, 2003 AbstractThis article introduces the February 2003 issue of MRS Bulletin on “Single-Event Upsets (SEUs) in Microelectronics.” These radiation effects in devices and circuits have been recognized in recent years as a key reliability concern for many current and future silicon-based technologies.
Henry H.K. Tang, Nils Olsson
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Single-event upsets in the Cluster and Double Star Digital Wave Processor instruments [PDF]
, 2013 Radiation-induced upsets are an important issue for electronic circuits operating in space. Upsets due to solar protons, trapped protons, and galactic cosmic rays are frequently observed.
Yearby, K.H., Balikhin, M., Walker, S.N.
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IEEE Access, 2022 In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The-Shelf (COTS) memories and emerging technology devices.
Golnaz Korkian +9 more
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