Results 21 to 30 of about 117,069,527 (207)

A 5-bit time to digital converter using time to voltage conversion and integrating techniques for agricultural products analysis by Raman spectroscopy

open access: yesInformation Processing in Agriculture, 2014
Time to digital converter (TDC) is a key block for time-gated single photon avalanche diode (SPAD) arrays for Raman spectroscopy that applicable in the agricultural products and food analysis. In this paper a new dual slope time to digital converter that
Mahdi Rezvanyvardom   +2 more
doaj   +1 more source

A High-Resolution Single-Photon Arrival-Time Measurement With Self-Antithetic Variance Reduction in Quantum Applications: Theoretical Analysis and Performance Estimation

open access: yesIEEE Transactions on Quantum Engineering, 2022
An almost all-digital time-to-digital converter (TDC) possessing subpicosecond resolutions, scalable dynamic ranges, high linearity, high noise immunity, and moderate conversion rates can be achieved by a random sampling-and-averaging (RSA) approach with
Tony Wu, Tzu-Chien Hsueh
doaj   +1 more source

From Sensing Mechanisms to System Co-Design: Graphene-Based Sensors and Readout Circuits. [PDF]

open access: yesAdv Sci (Weinh)
This review establishes a unified PS–EQ–RF framework linking graphene sensing mechanisms, native electrical outputs, and output‐specific readout circuits. Voltage‐, current‐, resistance‐, and capacitance‐type sensing systems are systematically classified to guide architecture selection, low‐noise design, system co‐design, and practical integration ...
Zhang J   +5 more
europepmc   +2 more sources

Time Resolution Improvement Using Dual Delay Lines for Field-Programmable-Gate-Array-Based Time-to-Digital Converters with Real-Time Calibration

open access: yesApplied Sciences, 2018
This paper presents a time-to-digital converter (TDC) based on a field programmable gate array (FPGA) with a tapped delay line (TDL) architecture. This converter employs dual delay lines (DDLs) to enable real-time calibrations, and the proposed DDL-TDC ...
Yuan-Ho Chen
doaj   +1 more source

A 13-Bit, 12-ps Resolution Vernier Time-to-Digital Converter Based on Dual Delay-Rings for SPAD Image Sensor

open access: yesSensors, 2021
A three-dimensional (3D) image sensor based on Single-Photon Avalanche Diode (SPAD) requires a time-to-digital converter (TDC) with a wide dynamic range and fine resolution for precise depth calculation. In this paper, we propose a novel high-performance
Zunkai Huang   +6 more
doaj   +1 more source

An 8-bit TDC implemented with two nested Johnson counters

open access: yesTecnología en Marcha, 2023
This work presents a Time-to-Digital Converter implemented using two nested Johnson counters and suitable for time-lapse measurement applications. The proposed structure is composed of two 4-bit nested counters, two digital-logic control networks, two ...
Jonathan Santiago-Fernandez   +3 more
doaj   +1 more source

Exponential extended flash time-to-digital converter [PDF]

open access: yes, 2016
IEEE International Nordic-Mediterranean Workshop on Time-to-Digital Converters and Applications (NoMe - TDC 2016), Krakow, Poland, June, 2016The digital-to-time converter (DTC)-based all- digital phase locked loop (ADPLL) attracts more and more attention
Chen, Peng   +3 more
core   +1 more source

Cross-Talk Issues in Time Measurements

open access: yesIEEE Access, 2021
The enormous diffusion of Time-Mode circuits, in particular Time-to-Digital Converter (TDC) time measurement circuits, and at the same time the dizzying increase in parallel channels required by the most recent applications, for example in the automotive
Nicola Lusardi   +4 more
doaj   +1 more source

A Low Temperature Coefficient Time-to-Digital Converter with 1.3 ps Resolution Implemented in a 28 nm FPGA

open access: yesSensors, 2022
Time-to-digital converter (TDC) is the key technology to realize accurate time delay measurement in high-precision optical fiber time-frequency transmission and synchronization, optical sensing and many scientific applications.
Xiangyu Mao   +5 more
doaj   +1 more source

Widening and narrowing of time interval due to single‐event transients in 45 nm vernier‐type TDC

open access: yesIET Circuits, Devices and Systems, 2017
Single‐event transients (SETs) due to heavy‐ion (HI) strikes adversely affect the electronic circuits in sub‐100 nm regime in radiation environment.
Pasupathy K. Ramaniharan, Bindu Boby
doaj   +1 more source

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