Results 11 to 20 of about 751 (187)

FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell

open access: yesIEEE Transactions on Circuits and Systems II: Express Briefs
International audienceThe Von-Neumann memory wall bottleneck that keeps expanding is mainly caused by the frequent data transfer between the main memory and the processor.
Girard, Patrick   +7 more
core   +2 more sources

FeFET based Logic-in-Memory: an overview [PDF]

open access: yes2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021
Emerging non-volatile memories are getting new interest in the system design community. They are used to design logic-in-memory circuits and propose alternatives to von-Neuman architectures. Hafnium oxide-based based ferroelectric memory technology, which is fully compatible with CMOS technologies is particularly interesting for logic-in-memory designs.
Cédric Marchand 0002   +5 more
openaire   +2 more sources

High-Performance and Area-Efficient Ferroelectric FET-Based Nonvolatile Flip-Flops

open access: yesIEEE Access, 2021
Recently, nonvolatile systems with nonvolatile flip-flops (NVFFs) have gained prominence for their energy efficiency in energy-harvesting devices and battery-operated Internet of Things applications. They are normally-off instantly-on, and thus, can save
Sekeon Kim   +4 more
doaj   +1 more source

Principles and Challenges for Binary Oxide Based Ferroelectric Memory FeFET

open access: yes, 2022
S.8-11In this paper, we give a perspective and recent overview of the emerging memory FeFET by shading the light on different aspects of the memory operation.
Ali, T.   +11 more
core   +2 more sources

A three-terminal non-volatile ferroelectric switch with an insulator–metal transition channel

open access: yesScientific Reports, 2022
Ferroelectrics offer a promising material platform to realize energy-efficient non-volatile memory technology with the FeFET-based implementations being one of the most area-efficient ferroelectric memory architectures.
Jaykumar Vaidya   +5 more
doaj   +1 more source

Variability in Planar FeFETs—Channel Percolation Impact

open access: yesIEEE Transactions on Electron Devices, 2023
sponsorship: This work was supported by the imec's Industrial Affiliation Program (IIAP). (imec's Industrial Affiliation Program (IIAP))
K. Kaczmarek   +9 more
openaire   +1 more source

Variability Study of Ferroelectric Field-Effect Transistors Towards 7nm Technology Node

open access: yesIEEE Journal of the Electron Devices Society, 2021
The random variation sources have a significant influence on the performance of ferroelectric field-effect transistor (FeFET). In this work, comparative analysis on the process variation induced variability of FeFET towards a 7 nm technology node has ...
Gihun Choe, Shimeng Yu
doaj   +1 more source

FeFET-Based Content-Addressable Storage Class Memory: Device Variation and High-Temperature Compatibility

open access: yes, 2023
Hafnium oxide (HfO2)-based ferroelectric field effect transistors (FeFETs) have revolutionized the emerging non-volatile memory area, especially with the potential to replace flash memories for several applications.
Yannick Raffel (12758051)   +10 more
core   +1 more source

Oxygen Scavenging in HfZrOx‐Based n/p‐FeFETs for Switching Voltage Scaling and Endurance/Retention Improvement

open access: yesAdvanced Electronic Materials, 2023
The authors demonstrate improved switching voltage, retention, and endurance properties in HfZrOx (HZO)‐based n/p‐ferroelectric field‐effect transistors (FeFETs) via oxygen scavenging.
Bong Ho Kim   +8 more
doaj   +1 more source

Defect profiling in FEFET Si:HfO2 layers [PDF]

open access: yesApplied Physics Letters, 2020
Ferroelectric Si-doped HfO2 is a promising candidate for future generation memory devices. However, such devices are vulnerable to significant threshold voltage shifts resulting from charge trapping in oxide defects. We use complementary characterization and modeling techniques to reveal significant electron trapping/de-trapping behavior, together with
B. J. O'Sullivan   +17 more
openaire   +1 more source

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