Results 51 to 60 of about 445 (155)

Modelling localized charge-injection region of the p-channel low-temperature polycrystalline silicon thin-film transistor

open access: yesJournal of Information Display, 2018
The low-temperature polycrystalline silicon (LTPS) thin-film transistor (TFT) is the optimal device for the backplane of the organic light-emitting diode display.
KwangHyun Choi   +5 more
doaj   +1 more source

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring

open access: yesAdvanced Intelligent Systems, Volume 6, Issue 10, October 2024.
The nonlinear variation decomposition is proposed to decompose output variations from neural network inputs and to evaluate the influence of unit processes in each sample from semiconductor manufacturing. Herein, industrial 1Y nm node dynamic random‐access memory test vehicles with baseline and split tests introducing high‐k metal gates with a minimum ...
Hyeok Yun   +11 more
wiley   +1 more source

Concealable physical unclonable functions using vertical NAND flash memory

open access: yesNature Communications
Physical Unclonable Functions (PUFs) can address the demand for enhanced hardware security. Vertical NAND (V-NAND) flash memory is the most commercialized non-volatile memory.
Sung-Ho Park   +5 more
doaj   +1 more source

An Innovative Indicator to Evaluate DRAM Cell Transistor Leakage Current Distribution

open access: yesIEEE Journal of the Electron Devices Society, 2018
This paper is the first to propose an innovative method for measuring variations in dynamic random access memory (DRAM) cell transistors. Structural dispersion induces an extremely high cell leakage current, which determines aspects of DRAM performance ...
Min Hee Cho   +7 more
doaj   +1 more source

Advances in Quantum Imaging with Machine Intelligence

open access: yesLaser &Photonics Reviews, Volume 18, Issue 8, August 2024.
Quantum imaging exemplifies the fascinating and counter‐intuitive nature of the quantum world, where non‐local correlations are exploited for the imaging of objects by remote and non‐interacting photons. The field has exploded of late, driven by advances in the fundamental understanding of these processes, but also by advances in technology.
Chané Moodley, Andrew Forbes
wiley   +1 more source

Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique

open access: yes, 2001
In this paper, we present an analysis of floating body effects in lateral asymmetric channel (LAC) and conventional homogeneously doped channel (uniform) SOI MOSFETs using a novel gate-induced-drain-leakage (GIDL) current technique. The parasitic bipolar
AATISH KUMAR   +5 more
core   +1 more source

Lateral Migration‐based Flash‐like Synaptic Device for Hybrid Off‐chip/On‐chip Training

open access: yesAdvanced Electronic Materials, Volume 10, Issue 4, April 2024.
The first‐ever engineering application of lateral migration in charge trap memory, which is perceived as a disadvantage in the memory industry, is proposed to achieve low‐power operation while maintaining superior retention and improving endurance. By varying the length of tunneling oxide, the proposed device diverges from conventional techniques in ...
Min‐Kyu Park   +6 more
wiley   +1 more source

DRAM 셀 트렌지스터의 GIDL RTN에 의한 산화막 트랩의 위치 의존성 분석 [PDF]

open access: yes, 2014
학위논문 (석사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2014. 2. Shin Hyungcheol.As device dimensions are minimized, random telegraph noise (RTN) is dominant in determining the performance and reliability of metal-oxide-semiconductor field effect transistor (MOSFET).
콴뉴엔기아
core  

Controlling L-BTBT in Emerging Nanotube FETs Using Dual-Material Gate

open access: yesIEEE Journal of the Electron Devices Society, 2018
Nanotube (NT) FETs have been proposed as the most promising architecture for the ultimate scaling of FETs. However, an enhanced L-BTBT restricts their scaling.
Aakash Kumar Jain   +2 more
doaj   +1 more source

Impact of Work-Function Variation in Ferroelectric Field-Effect Transistor

open access: yesIEEE Journal of the Electron Devices Society
We analyzed the impact of work-function variation (WFV) in ferroelectric field-effect transistor (FeFET). To analyze the operation characteristics, we employed the technology computer-aided design (TCAD) simulations. After evaluating ferroelectricity (FE)
Su Yeon Jung   +3 more
doaj   +1 more source

Home - About - Disclaimer - Privacy