Results 21 to 30 of about 2,431 (179)

Breakdown enhancement and hot electrons mitigation for p-GaN gate HEMTs by electric field modulation

open access: yesResults in Physics, 2023
In this article, an enhancement mode (E-mode) p-GaN gate AlGaN/GaN high electron mobility transistor (HEMT) with the novel strain technology (NST) has been proposed.
Jingyu Shen   +4 more
doaj   +1 more source

-GaN Gate Double-Channel GaN HEMT [PDF]

open access: yes, 2023
Electroluminescence (EL) of a Schottky-type p -GaN gate double-channel (DC-) GaN high-electron-mobility transistor (HEMT) was investigated to understand the mechanism of the carrier dynamics in the gate stack.
Tao Chen   +15 more
core   +1 more source

Enhancement of Breakdown Voltage in p-GaN Gate AlGaN/GaN HEMTs With a Stepped Hybrid GaN/AlN Buffer Layer

open access: yesIEEE Journal of the Electron Devices Society, 2022
A novel p-GaN gate AlGaN/GaN high electron mobility transistor (HEMT) structure with a stepped hybrid GaN/AlN buffer layer (S-HEMT) is proposed and simulated by the Sentaurus TCAD in this paper.
Yuan Wang   +5 more
doaj   +1 more source

of p-GaN Gate HEMT [PDF]

open access: yes, 2021
In this work, the impacts of OFF-state gate bias (VGS,OFF) on the dynamic on-resistance (RON) are investigated in the commercial Schottky-type p-GaN gate high-electron-mobility transistor (HEMT).
Xinran Huang   +11 more
core   +1 more source

Reliability of p-GaN Gate HEMTs in Reverse Conduction

open access: yesIEEE Transactions on Electron Devices, 2021
Synchronous buck converter comprises a low side (LS) and a high side (HS) switch, where the HS switch works in the first quadrant (forward conduction) whereas the LS switch works in the third quadrant (reverse conduction). However, the reliability of the p-GaN gate high electron mobility transistor (HEMT) in reverse conduction is unclear. In this work,
Cingu, Deepthi   +9 more
openaire   +3 more sources

High Dynamic Stability in Enhancement-Mode Active-Passivation p-GaN Gate HEMT [PDF]

open access: yes, 2023
The dynamic stability of E-mode active-passivation p-GaN gate HEMT (AP- HEMT) is investigated, including dynamic VTH shift, dynamic RON degradation, and dynamic leakage current.
Zheng, Zheyang   +11 more
core   +1 more source

Reliability, Applications and Challenges of GaN HEMT Technology for Modern Power Devices: A Review

open access: yesCrystals, 2022
A new generation of high-efficiency power devices is being developed using wide bandgap (WBG) semiconductors, like GaN and SiC, which are emerging as attractive alternatives to silicon. The recent interest in GaN has been piqued by its excellent material
Naeemul Islam   +5 more
doaj   +1 more source

p-GaN Selective Passivation via H Ion Implantation to Obtain a p-GaN Gate Normally off AlGaN/GaN HEMT [PDF]

open access: yes, 2023
A dependable and robust technique for nanomachining is ion implantation. In this work, hydrogen (H) ion implantation was used, for the first time, to passivate p-GaN, except for the gate area, in order to create a normally off p-GaN/AlGaN/GaN high ...
Zhongkai Du   +8 more
core   +1 more source

Characterization in Schottky-Type p-GaN Gate Power HEMT [PDF]

open access: yes, 2021
A multi-functional bootstrap voltage clamping circuit is proposed for characterizing the drain-bias-induced dynamic VTH, in which the GaN HEMT serves as the key bootstrapping device.
Zheng, Zheyang   +11 more
core   +1 more source

Piezotronic effect in a normally off p-GaN/AlGaN/GaN HEMT toward highly sensitive pressure sensor [PDF]

open access: yes, 2021
We report the effect of stress or strain on the electronic characteristics of a normally off AlGaN/GaN high electron mobility transistor (HEMT) and demonstrate its role as a highly sensitive pressure sensor.
Hong-Quan Nguyen   +19 more
core   +1 more source

Home - About - Disclaimer - Privacy