Results 261 to 270 of about 5,812,653 (293)
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Plasma Enhanced Atomic Layer Deposited Ru for MIMCAP Applications
ECS Meeting Abstracts, 2011Abstract not Available.
Johan Swerts +14 more
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Plasma Enhanced Atomic Layer Deposition of TaN Thin Films
ECS Meeting Abstracts, 2010Abstract not Available.
Paul Ma, Jiang Lu
openaire +1 more source
Plasma enhanced atomic layer deposition of copper: A comparison of precursors
Surface and Coatings Technology, 2013Abstract The growth of Cu films by atomic layer deposition using hydrogen plasma has been investigated. To obtain continuous films at sub 5 nm thicknesses the two dimensional coalescence of Cu nucleation sites formed at the start of the deposition process must be enhanced in preference to three dimensional island growth.
D.J. Hagen +7 more
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Plasma-enhanced atomic layer deposition of superconducting niobium nitride
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2016Thin films of niobium nitride are useful for their physical, chemical, and electrical properties. NbN superconducting properties have been utilized in a wide range of applications. Plasma-enhanced atomic layer deposition (PEALD) of NbN with (t-butylimido) tris(diethylamido) niobium(V) and remote H2/N2 plasmas has been investigated.
Mark J. Sowa +7 more
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Plasma-enhanced atomic layer deposition of Co on metal surfaces
Surface and Coatings Technology, 2015Abstract Co thin films were deposited using plasma-enhanced atomic layer deposition (PE-ALD) on various substrates such as Ru, Ta, SiO2, and Si. The growth characteristics of PE-ALD Co were investigated on the basis of their magnetic and electrical properties analyzed using a vibrating sample magnetometer (VSM) and four-point probe system ...
Jaehong Yoon +3 more
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Plasma enhanced atomic layer deposition of Ga
Journal of Materials Chemistry A, 2014Ranjith K. Ramachandran +7 more
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Growth of TiO2 with thermal and plasma enhanced atomic layer deposition.
Journal of nanoscience and nanotechnology, 2011We show a comparative study of the TiO2 ALD with TTIP and either O2 or O2-plasma on Si/SiO2 substrates. In particular we compare the surface morphology and crystalline phase by means of Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS) and X-ray Absorption Spectroscopy (XAS) for different O2-plasma procedures upon changing the time ...
Massimo, Tallarida +4 more
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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2023
Christoffer Kauppinen +2 more
exaly
Christoffer Kauppinen +2 more
exaly
Low-temperature growth of gallium oxide thin films by plasma-enhanced atomic layer deposition
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2020Ali Mahmoodinezhad +2 more
exaly
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2021
Mark Kushner, Chenhui Qu
exaly
Mark Kushner, Chenhui Qu
exaly

