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Preschoolers' Early Sentence Comprehension: Comparing Bilingual and Monolingual Children and the Role of Executive Function and Vocabulary Development. [PDF]

Dev Sci
Rodenhurst N, Messenger K.
europepmc   +1 more source

The impact of low-carbon city pilot policies on urban energy intensity. [PDF]

Front Public Health
Qian Y, Hu J, Guo B, Liu T, Hu H.
europepmc   +1 more source

Flexible and Interpretable Modeling of Overlapping Exposure Risks in Self-Controlled Case Series Analysis. [PDF]

Stat Med
Zhang X, Milligan P, Cheung YB.
europepmc   +1 more source

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Single-event effects on optical transceiver

2018 IEEE International Reliability Physics Symposium (IRPS), 2018
All communications systems use optical modules to achieve data transfer speeds in the 10's of GBPS range. With increasing reliance on communication systems, the impact of soft errors in optical transceiver modules has become a primary concern for system performance.
Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva   +4 more
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Predicting Single Event Effects in DRAM

2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019
The ability to leverage commodity memory in harsh environments due to radiation has the potential advance computing capability for aerospace and nuclear applications, among others. In this work, we provide the first demonstration of the existence of a small number of weak cells to single event effects for DDR3 memory when exposed to radiation.
Donald Kline Jr., Stephen Longofono, Rami G. Melhem, Alex K. Jones   +3 more
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Simulation and mitigation of single event effects

11th IEEE International On-Line Testing Symposium, 2005
This special session includes a presentation on nuclear codes used to determine a data-base of secondary ion species and their energies produced by the neutron-silicon and neutron-oxygen interactions, a presentation on FIT estimation tools using the secondary ions data-base created by the former codes and a presentation on design techniques suitable ...
Lorena Anghel, Michael Nicolaidis
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Estimating the effect of single-event upsets on microprocessors

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014
Evaluating the impact of single-event upsets (SEUs) on complex VLSI circuits in general, and microprocessors in particular, requires an interdisciplinary approach, that includes soft error modeling, accelerated measurements, derating of the raw error rates, and specialized design tools.
Cristian Constantinescu, Srini Krishnamoorthy, Tuyen Nguyen   +2 more
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