Results 61 to 70 of about 178 (144)

kV-class lateral NiOx/GaN superjunction diode via ammonia molecular beam epitaxy (NH3-MBE) [PDF]

open access: yesAPL Electronic Devices
This study reports the demonstration of lateral p-NiOx/p-GaN/n-GaN-based superjunction (SJ) diodes using p-GaN with additional sputtered p-type nickel oxide (NiOx) layers to realize charge-balanced structures. The SJ diode capacitance–voltage (C–V) model
Yizheng Liu   +4 more
doaj   +1 more source

Evaluation of etching damage of unintentionally doped GaN by C–V characteristics for charge balance evaluation of polarization superjunction GaN FET

open access: yesApplied Physics Express
The plasma etching of GaN induces an n-type surface conductive layer (SCL) that may disrupt the charge balance of the polarization superjunction structure formed by the polarization charge.
Eito Kokubo   +5 more
doaj   +1 more source

A Novel Deep-Trench Super-Junction SiC MOSFET with Improved Specific On-Resistance

open access: yesMicromachines
In this paper, a novel 4H-SiC deep-trench super-junction MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) with a split-gate is proposed and theoretically verified by Sentaurus TCAD simulations.
Rongyao Ma   +8 more
doaj   +1 more source

Simulation Studies of a Trench MOS Device Structure with Small Figures of Merit

open access: yesMATEC Web of Conferences, 2018
We proposed a vertical high permittivity trench power MOS (HKTMOS) device with alternating N&P drift region and high permittivity (HK) trench sandwiched in between.
Li Junhong
doaj   +1 more source

Determination of the effective critical breakdown field for Si, wide, and extreme bandgap semiconductor superjunction devices

open access: yesAIP Advances
Designing high voltage superjunction (SJ) power devices with wide bandgap and extreme bandgap semiconductors, when compared to silicon, can enhance the trade-off between RON,sp and BV significantly, due to their >10× higher avalanche breakdown electric ...
Mohamed Torky, T. Paul Chow
doaj   +1 more source

Multi-Split SOI Super-Junction VDMOS: A TCAD Simulation Study of the Single-Event Effect

open access: yesIEEE Access
This work presents a radiation-hardened Superjunction Vertical Double-Diffused MOSFET (SJ-VDMOS) architecture designed to improve robustness against destructive single-event effects (SEEs), specifically Single-Event Gate Rupture (SEGR) and Single-Event ...
Sanjeev Manoj Ranjan   +4 more
doaj   +1 more source

Novel Step Floating Islands VDMOS with Low Specific on-Resistance by TCAD Simulation. [PDF]

open access: yesMicromachines (Basel), 2022
Zhao D   +11 more
europepmc   +1 more source

Power Electronics Revolutionized: A Comprehensive Analysis of Emerging Wide and Ultrawide Bandgap Devices. [PDF]

open access: yesMicromachines (Basel), 2023
Rafin SMSH   +5 more
europepmc   +1 more source

Home - About - Disclaimer - Privacy